ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,528, issued on Sept. 16, was assigned to GOERTEK INC. (Shandong, China).
"Method and device for testing product quality" was invented by Yangyang Yu (Shandong, China) and Shiyu Li (Shandong, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method and device for testing product quality are disclosed. The method for testing product quality comprises: acquiring an image of a product to be tested; testing the image by using a pre-trained neural network model to obtain a testing result output by the neural network model; when the testing result indicates that the product to be tested is a defective product, performing a secondary judgment on the t...