US Patent Issued to GOERTEK on Jan. 20 for "Defect detection method and apparatus, and electronic device" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,760, issued on Jan. 20, was assigned to GOERTEK INC. (Shandong, China).

"Defect detection method and apparatus, and electronic device" was invented by Zengyuan Gai (Shandong, China) and Xiaoyu Chi (Shandong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection method and apparatus and an electronic device are disclosed. The method comprises: acquiring an image of an object to be detected (S1100); acquiring brightness information of pixels in the image (S1200); and acquiring appearance defect information of the object to be detected based on the brightness information (S1300), wherein the appearance defect information represents de...