US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on June 10 for "X-ray fluorescence (XRF) mapping for anode inspection" (Michigan Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,327,861, issued on June 10, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit).

"X-ray fluorescence (XRF) mapping for anode inspection" was invented by Shaomao Xu (Sterling Heights, Mich.), Michael P. Balogh (Novi, Mich.) and Daad Bourhan Haddad (Warren, Mich.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the disclosure include leveraging an X-ray fluorescence (XRF) mapping of copper current collectors for non-contact, non-destructive, in-line quality inspections of thin lithium metal anodes. An exemplary method can include receiving an electrode at a detection surface of the XRF detector. The electrode can include the lithium ano...