US Patent Issued to Global Unichip, Taiwan Semiconductor Manufacturing on Nov. 4 for "Testing circuit" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,150, issued on Nov. 4, was assigned to Global Unichip Corp. (Hsinchu, Taiwan) and Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Testing circuit" was invented by Yu-Lun Wan (Hsinchu, Taiwan), Bor-Yueh Liu (Hsinchu, Taiwan), Chen-Yuan Kao (Hsinchu, Taiwan) and Ting-Yu Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing circuit is provided. The testing circuit includes a clock cone, a series of shift register chains, and a control circuit. The clock cone is divided into a plurality of fan-out partitions operated in the same clock domain. The shift register chains are configured to shift out one-hot signals on...