US Patent Issued to GLOBAL UNICHIP, TAIWAN SEMICONDUCTOR MANUFACTURING on Dec. 30 for "Method of measuring chip characteristics, test device and non-transitory computer readable media" (Taiwanese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,589, issued on Dec. 30, was assigned to GLOBAL UNICHIP Corp. (Hsinchu, Taiwan) and TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Method of measuring chip characteristics, test device and non-transitory computer readable media" was invented by Ting-Hao Wang (Hsinchu, Taiwan) and Pei-Ju Lin (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of measuring chip characteristics includes: outputting an operating voltage to a chip by a test device, wherein the chip comprises a plurality of oscillator circuits configured to generate a plurality of oscillating signals according to the operating voltage; and testing ...