US Patent Issued to Global Unichip, Taiwan Semiconductor Manufacturing on Aug. 26 for "Capture IR drop analyzer and analyzing method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,065, issued on Aug. 26, was assigned to Global Unichip Corp. (Hsinchu, Taiwan) and Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Capture IR drop analyzer and analyzing method thereof" was invented by Chen-Yuan Kao (Hsinchu, Taiwan) and Min-Hsiu Tsai (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A capture IR drop analyzer and an analyzing method thereof are provided. The capture IR drop analyzing method includes: receiving circuit layout information and package model information of a circuit; analyzing a plurality of circuit blocks respectively corresponding to a plurality of bump current sources according to the c...