US Patent Issued to GIST(Gwangju Institute of Science and Technology) on Nov. 11 for "Focal stack alignment method and depth estimation method using the same" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,155, issued on Nov. 11, was assigned to GIST(Gwangju Institute of Science and Technology) (Gwangju, South Korea).

"Focal stack alignment method and depth estimation method using the same" was invented by Hae-Gon Jeon (Gwangju, South Korea) and Chang Yeon Won (Gwangju, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method of aligning images included in a focal stack and estimates depth information of an object in the images by extracting features of the aligned images, using a neural network model. A focal stack alignment method according to an embodiment of the present disclosure includes: calculating ...