ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,388,228, issued on Aug. 12, was assigned to Gigaphoton Inc. (Tochigi, Japan).
"Laser device and leak check method for laser device" was invented by Hiroaki Tsushima (Oyama, Japan), Yousuke Kawagoe (Oyama, Japan) and Makoto Tanaka (Oyama, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A leak check method for a laser device includes exposing a closed space accommodating laser medium gas to the atmosphere, isolating the closed space from the atmosphere after exposing the closed space to the atmosphere, introducing neon-containing gas containing neon gas to the closed space, and determining whether or not the neon gas is leaking to outside of the clos...