US Patent Issued to Georgia Tech Research on Feb. 4 for "Low-aberration high-speed-compatible optical delay lines and methods thereof" (Georgia Inventors)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,058, issued on Feb. 4, was assigned to Georgia Tech Research Corp. (Atlanta).

"Low-aberration high-speed-compatible optical delay lines and methods thereof" was invented by Marcus Cicerone (Atlanta) and Xavier Audier (Atlanta).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example architecture for providing a delay line for optical techniques. The delay line architecture includes a focusing element that has a focal axis disposed parallel to its length. The line of symmetry provided by the focal axis obviates path-length-dependent aberrations caused by the off-axis beam translations. The systems also provide varying geometries of movable mirrors, in...