ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,406, issued on June 10, was assigned to General Inspection LLC (Davisburg, Mich.).

"Inspection system for manufactured components" was invented by Mike Nygaard (Grand Blanc, Mich.), Nathan Kujacznski (Swartz Creek, Mich.) and Nadaly Marchi (Holly, Mich.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system configured to scan internal surfaces of manufactured components includes an optical probe, a light source, a conical mirror, and an imaging sensor. The optical probe has a field of view. The light source is spaced apart from the optical probe and is positioned within the field of view of the optical probe. The conical mirror is secur...