ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,864, issued on Jan. 13, was assigned to General Electric Co. (Evendale, Ohio).

"Component assessment method and apparatus" was invented by John Karigiannis (Laval, Canada), Shaopeng Liu (Clifton Park, N.Y.), James Vradenburg Miller (Clifton Park, N.Y.), Peihong Zhu (Clifton Park, N.Y.), David Cantin (Sherbrooke, Canada) and Jonathan R. Hootman (West Chester, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "A control circuit can access inspection results from an inspection of a first component and then input those inspection results to a first machine learning model. The inspection results include potential wear indications. By one approach, that ...