US Patent Issued to GENENTECH on July 15 for "Image quality analysis for artifact detection in pathology slide images" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,528, issued on July 15, was assigned to GENENTECH INC. (South San Francisco, Calif.).

"Image quality analysis for artifact detection in pathology slide images" was invented by Bingyuan Chen (South San Francisco, Calif.), Sertan Kaya (South San Francisco, Calif.) and Chetan Madhavarao Kulkarni (South San Francisco, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods relate to processing digital-pathology images. More specifically, aspects of the present disclosure are directed to accessing a whole-slide image depicting a slice of specimen, defining a set of tiles within at least part of the whole-slide image, generating one or m...