ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,367, issued on Nov. 4, was assigned to Fulian Precision Electronics (Tianjin) Co. LTD. (Tianjin, China).
"Defect detection method and terminal device" was invented by Wan-Hsin Tarng (New Taipei, Taiwan), Cheng-Ju Yang (Taipei, Taiwan) and Tsai-Ping Chu (New Taipei, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection method includes: obtaining an image of a first defective block output by the SPI machine; wherein the first defective block is a solder paste block that is not qualified for printing after being detected by the SPI machine; processing the image of the first defective block; detecting whether solder paste printing in t...