ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,633, issued on March 25, was assigned to Fulian Precision Electronics (Tianjin) Co. LTD. (Tianjin, China).
"Method for detecting defects and electronic device" was invented by Fu-Yuan Tan (Taoyuan, Taiwan) and Ching-Han Cheng (Taoyuan, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection method includes obtaining a first image corresponding to a first area on an object revealing an apparent defect, the first area bounding the area showing the apparent defect; selecting a detection model according to a size of the first image, the detection model selected being one of a group of three models based on dimensions of image, the imag...