US Patent Issued to FUKUDA on Dec. 23 for "Leak test condition design method, leak test condition design device, leak testing method, and leak testing device" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,346, issued on Dec. 23, was assigned to FUKUDA Co. LTD. (Tokyo).

"Leak test condition design method, leak test condition design device, leak testing method, and leak testing device" was invented by Mao Hirata (Tokyo) and Akimitsu Tanabe (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A leak test condition design method includes obtaining an internal volume of a test piece and a remaining internal volume of a test piece capsule with the test piece loaded for a differential pressure based air leak test; determining a test air pressure to be applied into the test piece capsule when the differential pressure based air leak test is performed; deter...