US Patent Issued to FUJIKIN on Dec. 9 for "Density measurement device" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,985, issued on Dec. 9, was assigned to FUJIKIN Inc. (Osaka, Japan).

"Density measurement device" was invented by Masaaki Nagase (Osaka, Japan), Hidekazu Ishii (Osaka, Japan), Kosuke Sugimoto (Osaka, Japan), Takashi Fukawa (Yokohama, Japan) and Wataru Ashino (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a concentration measurement device that can be miniaturized without using an optical fiber. The concentration measurement device including a measurement cell having a gas flow path and an optical path intersecting the gas flow path; a light source for emitting light inside the optical path, the light source 14 being instal...