ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,373, issued on Oct. 21, was assigned to FUJIFILM Corp. (Tokyo).
"Inspection support device, inspection support method, and program" was invented by Shuhei Horita (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "In an inspection support device that organizes a captured image including damage to a structure and includes a processor, the processor acquires image data including information regarding a structural drawing of a target structure on a medium, and damage identification information regarding the damage and captured image identification information regarding the captured image of the target structure having the damage that are added by a u...