US Patent Issued to FUJIFILM on May 27 for "Learning apparatus, learning method, and learning program, class classification apparatus, class classification method, and class classification program, and learned model" (Japanese Inventor)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,345, issued on May 27, was assigned to FUJIFILM Corp. (Tokyo).

"Learning apparatus, learning method, and learning program, class classification apparatus, class classification method, and class classification program, and learned model" was invented by Deepak Keshwani (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first learning unit performs learning of a first neural network that extracts a feature vector in each pixel of a target image including a plurality of objects and that outputs a feature map in which feature vectors of pixels belonging to individual objects included in the target image are clustered and distributed as a plurality ...