US Patent Issued to FUJIFILM on July 8 for "Kit for measuring measurement target substance and method for measuring measurement target substance" (Japanese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,753, issued on July 8, was assigned to FUJIFILM Corp. (Tokyo).

"Kit for measuring measurement target substance and method for measuring measurement target substance" was invented by Yoshinori Kanazawa (Ashigarakami-gun, Japan), Kazuhei Kaneko (Ashigarakami-gun, Japan) and Kouitsu Sasaki (Ashigarakami-gun, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present invention is to provide a kit for measuring a measurement target substance and a method for measuring a measurement target substance, which can exhibit a high noise suppression effect. According to the present invention, there is provide a kit for measuring a measurement t...