US Patent Issued to FUJIFILM on Jan. 28 for "Inspection support device, inspection support method, and inspection support program" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,209,972, issued on Jan. 28, was assigned to FUJIFILM Corp. (Tokyo).

"Inspection support device, inspection support method, and inspection support program" was invented by Shuhei Horita (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processor of the inspection support device acquires an image obtained by imaging a structure to be inspected and detects damage to the structure on the basis of the acquired image. In a case where two or more types of damage (cracking B and linear free lime C2) to the structure are detected, the processor determines whether or not two or more types of damage are detected from the same or adjacent positions. In a case...