US Patent Issued to FUJIFILM on Jan. 27 for "Structure damage cause estimation system, structure damage cause estimation method, and structure damage cause estimation server" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,646, issued on Jan. 27, was assigned to FUJIFILM Corp. (Tokyo).

"Structure damage cause estimation system, structure damage cause estimation method, and structure damage cause estimation server" was invented by Shuhei Horita (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A structure damage cause estimation system, a structure damage cause estimation method, and a structure damage cause estimation server that enable a damage cause to be estimated with a high probability are provided. A structure damage cause estimation system (100) includes a database (110) that has data of a captured image and a damage cause of a structure, an image acquisiti...