US Patent Issued to FUJIFILM on Feb. 3 for "Feature quantity calculating method, feature quantity calculating program, feature quantity calculating device, screening method, screening program, and compound creating method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,197, issued on Feb. 3, was assigned to FUJIFILM Corp. (Tokyo).

"Feature quantity calculating method, feature quantity calculating program, feature quantity calculating device, screening method, screening program, and compound creating method" was invented by Kyosuke Tsumura (Minami-Ashigara, Japan), Jun Nakabayashi (Minami-Ashigara, Japan) and Shino Ohira (Minami-Ashigara, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present invention is to provide a method, a program, and a device which enable calculation of a feature quantity accurately indicating chemical properties of a target structure. Further, another object of the pre...