ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,978, issued on Dec. 9, was assigned to FUJIFILM Corp. (Tokyo).
"Optical measurement device" was invented by Sohichiro Nakamura (Kanagawa, Japan) and Kenichi Hamada (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an optical measurement device capable of easily measuring a scattering intensity at different scattering angles or different wavelengths. An optical measurement device with a low-coherence interferometer includes a detection unit having at least one of a first detection unit that detects an interference light intensity per wavelength by means of interference between at least a part of scattered light obtained by al...