US Patent Issued to FUJIFILM on Dec. 23 for "Radiation image analysis device, method of operating radiation image analysis device, and non-transitory computer readable medium" (Japanese Inventor)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,540, issued on Dec. 23, was assigned to FUJIFILM Corp. (Tokyo).

"Radiation image analysis device, method of operating radiation image analysis device, and non-transitory computer readable medium" was invented by Tomoko Taki (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The radiation image analysis device acquires an X-ray image obtained by performing X-ray radiography on a subject including a bone part, acquires a rotation angle from a reference position of the bone part on the basis of the X-ray image, and acquires bone quantity information of the bone part by correcting pre-correction bone quantity information of the bone part ob...