US Patent Issued to FUJIFILM on April 29 for "Imaging method and imaging device calculating the correlation between light intensity and a spatially modulated mask image to construct an image of a target object" (Japanese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,289,540, issued on April 29, was assigned to FUJIFILM Corp. (Tokyo).

"Imaging method and imaging device calculating the correlation between light intensity and a spatially modulated mask image to construct an image of a target object" was invented by Masayuki Naya (Kanagawa, Japan), Ryusuke Osaki (Kanagawa, Japan) and Sohichiro Nakamura (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Pixels of a mask image with which a target object is irradiated are shifted by a determined distance by sequentially turning on one light emission point or two or more light emission points of a light source with respect to a single mask pattern generated in ...