ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,618, issued on Nov. 18, was assigned to FUJI Corp. (Chiryu, Japan).
"Analysis support device and analysis support system" was invented by Takafumi Mitsuya (Nishio, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis support device includes a display; a first display control section configured to display a first screen including a device scheduled image and a device actual result image on the display when a device actual result time at which a mounting device actually performs a mounting step of mounting a component on a substrate is delayed; and a second display control section configured to display a second screen including a preparati...