ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,502, issued on Jan. 27, was assigned to FUJI Corp. (Aichi, Japan).
"Measuring device" was invented by Toshiyuki Sawada (Toyota, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "This is an improvement of a measuring device, for example, it is possible to stably measure an electrical characteristic even when a component is small. In the present measuring device, a recessed portion capable of accommodating at least a part of the components is provided in at least one of the pair of probes that grips the components. As described above, since a part of the components is accommodated in the recessed portion, it is possible to obtain at least one of th...