ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,064, issued on Feb. 4, was assigned to FUJI Corp. (Chiryu, Japan).
"Inspection device" was invented by Tomoya Fujimoto (Nagoya, Japan), Takahiro Kobayashi (Chiryu, Japan) and Yuki Inaura (Chiryu, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection device is such that the inspection device executes a mounting inspection of a component using an inspection image of a board on which the component is mounted and includes an imaging device and an image processing device. The imaging device obtains three monochromatic images of the board in R, G, B. The image processing device sets a board color using brightness values of the three monochroma...