US Patent Issued to FUJI ELECTRIC on Oct. 7 for "Semiconductor device and method for determining deterioration of semiconductor device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,438,056, issued on Oct. 7, was assigned to FUJI ELECTRIC Co. LTD. (Kawasaki, Japan).

"Semiconductor device and method for determining deterioration of semiconductor device" was invented by Motohito Hori (Matsumoto, Japan), Yoshinari Ikeda (Matsumoto, Japan), Takaaki Tanaka (Hachioji, Japan) and Qichen Wang (Hino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a first input conductive plate on which a plurality of first semiconductor chips arranged in a first direction, a first output conductive plate extending in the first direction and being provided adjacent to the first input conductive plate, a case having first ...