US Patent Issued to FUJFILM on Feb. 3 for "Ultraviolet inspection tool, ultraviolet inspection kit, and ultraviolet inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,848, issued on Feb. 3, was assigned to FUJFILM Corp. (Tokyo).

"Ultraviolet inspection tool, ultraviolet inspection kit, and ultraviolet inspection method" was invented by Kimi Ikeda (Shizuoka, Japan) and Daisuke Arioka (Shizuoka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides an ultraviolet inspection tool having excellent color formability with respect to light having a wavelength of 222 nm even in a case where an irradiation amount of the light having a wavelength of 222 nm is small, an ultraviolet inspection kit, and an ultraviolet inspection method. The ultraviolet inspection tool of the present invention is a...