US Patent Issued to FUDAN UNIVERSITY on Nov. 25 for "High-sensitivity three-dimensional topography recovery method based on dual-channel differentiation" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,483,785, issued on Nov. 25, was assigned to FUDAN UNIVERSITY (Shanghai).

"High-sensitivity three-dimensional topography recovery method based on dual-channel differentiation" was invented by Xiangchao Zhang (Shanghai), Yunuo Chen (Shanghai), Wei Lang (Shanghai), Sihan Chen (Shanghai) and Chengzhuo Wang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to precision measurement technology, specifically a high-sensitivity three-dimensional topography recovery method using dual-channel differentiation. Enhancing a traditional microscopic imaging system, a beam splitter is added between the objective lens and tube lens. This crea...