US Patent Issued to FormFactor on Aug. 5 for "Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test" (Japanese, Singaporean, American Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,395, issued on Aug. 5, was assigned to FormFactor Inc. (Livermore, Calif.).

"Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test" was invented by Choon Beng Sia (Singapore), Yoichi Funatoko (Tokyo), Isao Kunioka (Yokahama, Japan), Masanori Watanabe (Tokyo), Peter Andrews (Beaverton, Ore.) and Ken Dawson (McMinnville, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test (DUT). In some examples, the probe blades are configured to provide a Kelvin electrical con...