ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,100, issued on July 1, was assigned to Ford Global Technologies LLC (Dearborn, Mich.).
"Systems and methods for detecting manufacturing anomalies" was invented by Andreas Billstein (Nordrhein Westfalen, Germany), Illa Kesten-Kuehne (Gummersbach, Germany), Hessel van Dijk (Roesrath, Germany) and Michael Higgins (Witham, Great Britain).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are described for training a model for detecting manufacturing anomalies. A test response parameter is identified at a computing device, and a first plurality of component waveforms associated with the test response parameter are received at the computing ...