US Patent Issued to FNV IP on July 15 for "Apparatus, method and system for measuring locations on an object" (Dutch Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,359,914, issued on July 15, was assigned to FNV IP B.V. (Leidschendam, Netherlands).

"Apparatus, method and system for measuring locations on an object" was invented by Arnoud Marc Jongsma (Leidschendam, Netherlands), Dennis van Weeren (Leidschendam, Netherlands) and Mario Josephus De Bijl (Leidschendam, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for monitoring survey reflectors arranged at a plurality of locations on an object, having: a camera, including: one or more light sources arranged to illuminate a field in space corresponding to at least 10% of a field of view of the camera, preferably the whole field of view; an image...