US Patent Issued to Fluke on March 11 for "High-throughput temperature screening for persons with temperature anomalies" (Wisconsin Inventor)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,249,179, issued on March 11, was assigned to Fluke Corp. (Everett, Wash.).

"High-throughput temperature screening for persons with temperature anomalies" was invented by Matthew F. Schmidt (River Falls, Wis.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for screening persons' temperatures comprises an imaging device configured to generate imagery data, including infrared image data, of a first scene and a second scene. The system receives imagery data from the first scene, identifies persons in the scene using the imagery data, and determines each person's temperature. The system further compares the persons' temperatures to a threshold and i...