US Patent Issued to FEI on Nov. 4 for "Method and system for studying samples using a scanning transmission charged particle microscope with reduced beam induced sample damage" (Dutch Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,009, issued on Nov. 4, was assigned to FEI Co. (Hillsboro, Ore.).

"Method and system for studying samples using a scanning transmission charged particle microscope with reduced beam induced sample damage" was invented by Maarten Bischoff (Eindhoven, Netherlands) and Bert Freitag (Eindhoven, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure relates to a method for examining a sample in a scanning transmission charged particle microscope. The method comprises the steps of providing a scanning transmission charged particle microscope, having an illuminator and a scanning unit. The method comprises the steps of providing a desired...