US Patent Issued to FEI on March 18 for "Transmission charged particle microscope with an electron energy loss spectroscopy detector" (Dutch Inventor)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,255,045, issued on March 18, was assigned to FEI Co. (Hillsboro, Ore.).

"Transmission charged particle microscope with an electron energy loss spectroscopy detector" was invented by Peter Christiaan Tiemeijer (Eindhoven, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a transmission charged particle microscope comprising a charged particle beam source for emitting a charged particle beam, a sample holder for holding a sample, an illuminator for directing the charged particle beam emitted from the charged particle beam source onto the sample, and a control unit for controlling operations of the transmission charged pa...