US Patent Issued to FEI on Jan. 20 for "Techniques for imaging low duty cycle signals using a scanning electron microscope" (California Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,531,203, issued on Jan. 20, was assigned to FEI Co. (Hillsboro, Ore.).

"Techniques for imaging low duty cycle signals using a scanning electron microscope" was invented by Neel Leslie (San Jose, Calif.) and James Vickers (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, components, methods, and algorithms for generating difference data are described. A computer-implemented method includes directing a first pulse of charged particles toward a sample. The method can include generating first detector data based at least in part on interactions between the charged particles of the first pulse and the sample. The method can include di...