ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,724, issued on Jan. 20, was assigned to FEI Co. (Hillsboro, Ore.).
"Capacitance-based detection of probe contact" was invented by Shyam Sundar Aswadha Narayanan (Richardson, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for detecting contact of a probe on a surface are described. A computer-implemented method for detecting nanoscale contact of a probe tip on a surface includes positioning a probe tip at a first displacement relative to a sample surface, the sample surface exposing one or more nanostructures. The method can include displacing the probe tip toward the sample surface. The method can include generating response data fo...