US Patent Issued to FEI on Feb. 10 for "Application management for charged particle microscope devices" (Dutch Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,732, issued on Feb. 10, was assigned to FEI Co. (Hillsboro, Ore.).

"Application management for charged particle microscope devices" was invented by Pavel Potocek (Eindhoven, Netherlands), Maurice Peemen (Rijsbergen, Netherlands) and Remco Schoenmakers (Best, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, an example method may comprise receiving, by a first device located at a premises and from a second device located external to the premises, and via a network, configura...