US Patent Issued to FEI on April 29 for "Live-assisted image acquisition method and system with charged particle microscopy" (Dutch, German Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,288,667, issued on April 29, was assigned to FEI Co. (Hillsboro, Ore.).

"Live-assisted image acquisition method and system with charged particle microscopy" was invented by Pavel Potocek (Eindhoven, Netherlands), Bert Henning Freitag (Brueggen, Germany) and Maurice Peemen (Rijsbergen, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of imaging a sample includes acquiring one or more first images of a region of the sample at a first imaging condition with a charged particle microscope system. The one or more first images are applied to an input of a trained machine learning model to obtain a predicted image indicating atom structure pro...