US Patent Issued to FARO TECHNOLOGIES on June 3 for "Defect detection in a point cloud" (German Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,169, issued on June 3, was assigned to FARO TECHNOLOGIES (Lake Mary, Fla.).

"Defect detection in a point cloud" was invented by Georgios Balatzis (Fellbach, Germany) and Tharesh Sharma (Waiblingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Examples described herein provide a method that includes performing a first scan of an object to generate first scan data. The method further includes detecting a defect on a surface of the object by analyzing the first scan data to identify a region of interest containing the defect by comparing the first scan data to reference scan data. The method further includes performing a second scan of the reg...