ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,516, issued on Nov. 4, was assigned to FANUC Corp. (Yamanashi, Japan).
"Abnormality detection device" was invented by Liancheng Hu (Yamanashi, Japan), Kazuhiro Satou (Yamanashi, Japan) and Kazunori Iijima (Yamanashi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "This abnormality detection device: causes a motor that drives a drive unit at a plurality of rotational speeds to perform a detection operation based on a command for diagnosing the state of the drive unit, acquires, as information indicating the operating state of the drive unit, a control command for the motor driving the drive unit or a feedback signal from the motor driving the dri...