US Patent Issued to FANUC on Nov. 18 for "Three-dimensional-measurement device and three-dimensional-measurement method" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,477,238, issued on Nov. 18, was assigned to FANUC Corp. (Yamanashi, Japan).

"Three-dimensional-measurement device and three-dimensional-measurement method" was invented by Fumikazu Warashina (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A three-dimensional measurement device includes a projector for scanning and projecting reference light onto an object, and a light receiver for receiving the reflected reference light by the object. The light receiver monitors a luminance change for each pixel and outputs an event when the luminance change meets or exceeds a preset threshold. Each event includes the pixel's position, the time of the l...