US Patent Issued to FANUC on June 10 for "Three-dimensional measuring device, and three- dimensional measuringmethod" (Japanese Inventor)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,329, issued on June 10, was assigned to FANUC Corp. (Yamanashi, Japan).

"Three-dimensional measuring device, and three- dimensional measuringmethod" was invented by Yuusuke Oota (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The objective of the present invention is to appropriately set a distance range for calculating a gradation degree, in accordance with the height of a workpiece. This three-dimensional measuring device is provided with: a three-dimensional sensor which images a workpiece to acquire three-dimensional information; a setting unit which, on the basis of the acquired three-dimensional information, sets a reference p...