ALEXANDRIA, Va., July 23 -- United States Patent no. 12,369,245, issued on July 22, was assigned to FANUC Corp. (Yamanashi, Japan).
"Printed circuit board for degradation detection" was invented by Takeshi Sawada (Yamanashi-ken, Japan) and Fuyuki Ueno (Yamanashi-ken, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a printed circuit board for degradation detection, the printed circuit board having an insulator substrate and a wiring pattern for degradation detection, the wiring pattern being formed on an outer surface of the insulator substrate, and the printed circuit board for degradation detection being attached to a main printed circuit board for which degradation is to be detected. The w...