US Patent Issued to Fanuc on July 15 for "Object detection device and model pattern evaluation device" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,582, issued on July 15, was assigned to Fanuc Corp. (Yamanashi, Japan).

"Object detection device and model pattern evaluation device" was invented by Shoutarou Ogura (Yamanashi, Japan) and Fumikazu Warashina (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A model pattern evaluation device for a robotic system comprises a processor. The processor is configured to: receive an image in which a target object is represented captured by a camera attached to a movable robotic component of the robotic system; calculate, for detecting the target object from the image, an evaluation value representing a geometric distribution of a plurality o...