US Patent Issued to FANUC on July 1 for "Abnormality determination system and program" (Japanese Inventor)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,615, issued on July 1, was assigned to FANUC Corp. (Yamanashi, Japan).

"Abnormality determination system and program" was invented by Nobuhito Oonishi (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an abnormality determination system and program that make it possible to accurately detect abnormalities at a machine tool. An abnormality determination system that comprises a detection threshold determination unit that determines a detection threshold for detecting abnormalities at the machine tool on the basis of a motor inference information and an inference precision, a motor measurement unit that acquires motor measurem...