US Patent Issued to FANUC on Feb. 25 for "Image analysis device, control device, mechanical system, image analysis method, and computer program for image analysis" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,236,577, issued on Feb. 25, was assigned to FANUC Corp. (Yamanashi, Japan).

"Image analysis device, control device, mechanical system, image analysis method, and computer program for image analysis" was invented by Tomoyuki Aizawa (Yamanashi, Japan), Junichi Tezuka (Yamanashi, Japan) and Satoshi Ikai (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various factors may cause an error between the shape of a workpiece machined by an industrial machine and the target shape of the workpiece. An image analysis device includes a first image generating section that generates first image data indicating a first distribution of locations on a work...