US Patent Issued to Eyetech, Nippon Signal on July 29 for "System for non-destructively inspecting baggage, method for nondestructively inspecting baggage, program, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,483, issued on July 29, was assigned to Eyetech Co. Ltd. (Tokyo) and Nippon Signal Co. Ltd. (Tokyo).

"System for non-destructively inspecting baggage, method for nondestructively inspecting baggage, program, and recording medium" was invented by Yosuke Tsuji (Tokyo), Shinya Saito (Tokyo), Tatsuro Hayashi (Tokyo), Eishi Kawasaki (Saitama, Japan), Masaki Takahashi (Saitama, Japan) and Kazuaki Takayama (Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are system, method, program, and recording medium for non-destructively inspecting baggage in which an inspection corresponding to an article to be inspected is performed even when t...